Mitutoyo's MiSCAN vision system performs autonomous scanning covering micro-form to larger workpieces

Mitutoyo Corporation releases its MiSCAN Vision System, a multiple sensor microscopic-form measurement system using combined coordinate measuring machine (CMM) and vision measurement system technology and features a micro-form scanning probe.

It perform accurate autonomous scanning covering micro-form to larger workpieces. The new MPP-NANO probe can use styli as small as 125 μm diameter to achieve measurement of microscopic workpieces. Using the observation camera, setup of measurement can be easily achieved. The SP25M scanning probe is also supported to allow small- and large-sized workpieces and features to be measured.

The system utilizes the same image head as Mitutoyo’s Quick Vision measuring system. The Quick Vision Apex lighting system is also incorporated, providing multiple lighting functions and evaluation software to provide high performance.

The Vision System and MPP-NANO now enables scanning measurement using the stylus on holes with a maximum aspect ratio of 17:1.

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