MKS Instruments’ Ophir BeamPeek measurement system includes cooling cartridge

MKS Instruments Inc. has introduced the Ophir BeamPeek, an integrated beam analysis and power measurement system for real-time measurement of lasers in additive manufacturing chambers. It provides simultaneous beam profiling, focal spot analysis, and power measurement in 3 seconds. There is no need for water or fan cooling, as the system includes a replaceable passive cooling beam dump tray that eliminates downtime between measurement sessions.

The system is suitable for field service testing of additive manufacturing chamber powder beds. It can withstand chamber conditions, including the presence of metal powder residuals and when cooling agents or airflow connection points are not available.

MKS Instruments Inc. | www.ophiropt.com